Polydentate Ligand Reinforced Chelating to Stabilize Buried Interface toward High‐Performance Perovskite Solar Cells

Author:

Liu Baibai1,Zhou Qian1,Li Yong2,Chen Yu1,He Dongmei1,Ma Danqing1,Han Xiao1,Li Ru1,Yang Ke3,Yang Yingguo4,Lu Shirong5,Ren Xiaodong6,Zhang Zhengfu7,Ding Liming8,Feng Jing7,Yi Jianhong7,Chen Jiangzhao17ORCID

Affiliation:

1. Key Laboratory of Optoelectronic Technology & Systems (Ministry of Education) College of Optoelectronic Engineering Chongqing University Chongqing 400044 China

2. Key Laboratory of Applied Surface and Colloid Chemistry Ministry of Education Shaanxi Key Laboratory for Advanced Energy Devices Shaanxi Engineering Lab for Advanced Energy Technology Institute for Advanced Energy Materials School of Materials Science and Engineering Shaanxi Normal University Xi'an 710119 China

3. Chongqing Institute of Green and Intelligent Technology Chinese Academy of Sciences Chongqing 400714 China

4. School of Microelectronics Fudan University Shanghai 200433 China

5. Department of Material Science and Technology Taizhou University Taizhou 318000 China

6. Yunnan Key Laboratory for Micro/Nano Materials & Technology International Joint Research Center for Optoelectronic and Energy Materials School of Materials and Energy Yunnan University Kunming 650091 China

7. Faculty of Materials Science and Engineering Kunming University of Science and Technology Kunming 650093 China

8. Center for Excellence in Nanoscience (CAS) Key Laboratory of Nanosystem and Hierarchical Fabrication (CAS) National Center for Nanoscience and Technology Beijing 100190 China

Abstract

AbstractThe instability of the buried interface poses a serious challenge for commercializing perovskite photovoltaic technology. Herein, we report a polydentate ligand reinforced chelating strategy to strengthen the stability of buried interface by managing interfacial defects and stress. The bis(2,2,2‐trifluoroethyl) (methoxycarbonylmethyl)phosphonate (BTP) is employed to manipulate the buried interface. The C=O, P=O and two −CF3 functional groups in BTP synergistically passivate the defects from the surface of SnO2 and the bottom surface of the perovskite layer. Moreover, The BTP modification contributes to mitigated interfacial residual tensile stress, promoted perovskite crystallization, and reduced interfacial energy barrier. The multidentate ligand modulation strategy is appropriate for different perovskite compositions. Due to much reduced nonradiative recombination and heightened interface contact, the device with BTP yields a promising power conversion efficiency (PCE) of 24.63 %, which is one of the highest efficiencies ever reported for devices fabricated in the air environment. The unencapsulated BTP‐modified devices degrade to 98.6 % and 84.2 % of their initial PCE values after over 3000 h of aging in the ambient environment and after 1728 h of thermal stress, respectively. This work provides insights into strengthening the stability of the buried interface by engineering multidentate chelating ligand molecules.

Publisher

Wiley

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