Effect of incident probe on HAADF STEM images
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference35 articles.
1. High-resolution imaging of silicon (111) using a 100 keV STEM
2. Instrumental factors in high-resolution FEG STEM
3. Image Contrast And Localized Signal Selection Techniques
4. High-resolution incoherent imaging of crystals
5. High-resolution Z-contrast imaging of crystals
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