Instrumental factors in high-resolution FEG STEM-Reference-Cited by-同舟云学术

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Instrumental factors in high-resolution FEG STEM

Published:1995-04 Issue:1 Volume:58 Page:1-5
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

von Harrach H.S.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. High-resolution Z-contrast imaging of crystals

2. Proc. 51st MSA Meeting, 1993;Coene,1993

3. Atomic resolution Z-contrast imaging of interfaces

4. Maximum Entropy Solutions Ltd., Cambridge, UK.

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