Application of wavelength-resolved optically-detected XAS methods to phase-segregated silicates
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference21 articles.
1. X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)
2. Luminescence excitation characteristics of Ca-, Na- and K-aluminosilicates (feldspars), in the stimulation range 20 500 eV: optical detection of XAS
3. Recombination luminescence and energy transfer in ionic crystals at XUV excitation by synchrotron radiation
4. Core Shell Spectroscopy of Rapidly Oxidised Porous Silicon. Linking the Chemical and Electronic Structure
5. XEOL Studies of Porous Silicon
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1. On the role of Fe2+in the luminescence of feldspar: an exploration of Fe2+/Fe3+L-edge near edge x-ray absorption fine structure using comparative electronic and optical detection methods;Journal of Physics D: Applied Physics;2011-11-18
2. An investigation of cathodoluminescence in albite from the A-type Georgeville granite, Nova Scotia;Lithos;2010-01
3. Optically Detected X-ray Absorption Spectroscopy Measurements as a Means of Monitoring Corrosion Layers on Copper;Analytical Chemistry;2008-11-15
4. X-ray absorption and luminescence properties of metallic copper nanoparticles embedded in a glass matrix;physica status solidi (b);2006-05
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