XEOL Studies of Porous Silicon
Author:
Publisher
EDP Sciences
Subject
General Physics and Astronomy
Link
http://jp4.journaldephysique.org/10.1051/jp4/1997094/pdf
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low-dimensional systems investigated by x-ray absorption spectroscopy: a selection of 2D, 1D and 0D cases;Journal of Physics D: Applied Physics;2013-09-26
2. X-Ray Absorption Fine Structure in the Study of Semiconductor Heterostructures and Nanostructures;Characterization of Semiconductor Heterostructures and Nanostructures;2013
3. Temporal- and Site-Specific Determination of the Origin of the Luminescent Bands in Silicon Nanowires;The Journal of Physical Chemistry C;2008-08-16
4. X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures;Characterization of Semiconductor Heterostructures and Nanostructures;2008
5. New instrumentation for micro-imaging X-ray absorption spectroscopy using optical detection methods;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-05
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