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3. in: Surface Analysis – The Principle Techniques, edited by John C. Vickerman (John Wiley Sons, New York/Chichester, 1997), p. 215.
4. in: Surface and Thin Film Analysis, edited by H. Bubert and H. Jenett (Wiley-VCH, Weinheim, 2002), p. 150.
5. Explanation of the surface peak in charge integrated LEIS spectra