High resolution time-of-flight low energy ion scattering-Reference-Cited by-同舟云学术

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High resolution time-of-flight low energy ion scattering

Published:2005-04 Issue:1-4 Volume:230 Page:398-401
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Draxler M.,Markin S.N.,Kolíbal M.,Průša S.,Šikola T.,Bauer P.

Funder

Austrian Science Fund

Österreichische Austauschdienst

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. Science of Ceramic Interfaces II;Brongersma,1994

2. Surface Analysis – The principle techniques;Taglauer,1997

3. Surface and Thin Film Analysis;Bauer,2002

4. Comparison of a time-of-flight system with an electrostatic analyzer in low-energy ion scattering

5. ACOLISSA: a powerful set-up for ion beam analysis of surfaces and multilayer structures

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS);Handbook of Surface and Interface Analysis;2009-06-24

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