In Situ, Real-Time Infrared (IR) Imaging for Metrology in Advanced Manufacturing

Author:

Tofail Syed A. M.1,Mani Aladin1,Bauer Joanna2,Silien Christophe1

Affiliation:

1. Department of Physics and Bernal Institute; University of Limerick; National Technological Park Ireland

2. Faculty of Fundamental Problems of Technology; Department of Bioengineering; Wroclaw University of Science and Technology; Wybrzeze Wyspianskiego 27 Wroclaw 50-370 Poland

Funder

Science Foundation Ireland

European Regional Development Fund

Seventh Framework Programme

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Luminescence‐Based Infrared Thermal Sensors: Comprehensive Insights;Small;2023-09-07

2. Integration of Non-Destructive Inspection (NDI) systems for Zero-Defect Manufacturing in the Industry 4.0 era;2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT);2023-06-06

3. Infrared imaging of polydimethylsiloxane-doped upconversion particle composites;Review of Scientific Instruments;2023-01-01

4. Role of Metrology in the Advanced Manufacturing Processes;Handbook of Metrology and Applications;2023

5. Role of Metrology in the Advanced Manufacturing Processes;Handbook of Metrology and Applications;2022-12-29

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