Recent studies of surface dynamic processes by reflection electron microscopy-Reference-Cited by-同舟云学术

Recent studies of surface dynamic processes by reflection electron microscopy

Published:1992-02-15 Issue:4 Volume:20 Page:333-340
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

Yagi Katsumichi,Yamanaka Akira,Homma Itsuro

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference37 articles.

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4. Reflexion electron microscopy using diffracted electrons

5. and (1991) REM and TEM studies of 2D Au-Cu alloy adsorbate on Si(111) surface. Proceedings of the 16th Yamada Conference ?Surface as a New Material,? Osaka, July 1990. Surface Sci. 242: 81.

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1. Stationary Beam Methods;Electron Microscopy;2007-12-23

2. Analyses of HF/NH4F buffer-treated Si(111) surfaces using XPS, REM and SIMS;Applied Physics A Materials Science & Processing;1996-03

3. Analyses of HF/NH 4 F buffer-treated Si(1 1 1) surfaces using XPS, REM and SIMS;Applied Physics A: Materials Science & Processing;1996-02-27

4. Simulation of high-resolution REM images;Surface Science;1993-12

5. Simulation of reflection electron microscopy images: application to high-resolution imaging of the Si(001)2 × 1 surface;Surface Science;1993-11