23‐4: Channel‐Dimension‐Scalable Oxide Thin‐Film Transistor for High‐Resolution Pixel and Integrated Gate Driver
Author:
Affiliation:
1. JOLED Inc. 19, Nishikujo Kasuga-cho Minami-ku, Kyoto 601-8413 Japan
Publisher
Wiley
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.12921
Reference18 articles.
1. Development of 55” 4K UHD OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs
2. 28-2: A Novel OLED Display Panel with High-Reliability Integrated Gate Driver Circuit using IGZO TFTs for Large-Sized UHD TVs
3. AlO sputtered self‐aligned source/drain formation technology for highly reliable oxide thin film transistor backplane
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