Quantitative XRF analysis of surface layers: Procedure for the determination of thickness and composition
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference13 articles.
1. Quantitative XRF analysis of surface layers: Influence of primary energy distribution and enhancement
2. A Simple Treatment of Secondary Excitation in X-Ray Emission Analysis
3. On the calculation of X-ray fluorescence line intensities excited from thin layers on thick substrates
4. Lama III — A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers
5. X-ray fluorescence analysis of multiple-layer films
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1. Measurements of Thin Layers After the Coating Process;Handbook of Thin-Film Technology;2015
2. Determination of the thickness of coatings by means of a new XRF spectrometer;X-Ray Spectrometry;2002-01
3. MEASUREMENT OF FOIL AND CABLE THICKNESSES BY A TRANSMISSION METHOD;Instrumentation Science & Technology;2001-11-30
4. Determination of the Sample Thicknesses by Intensity Ratio Measurement by Energy Dispersive X-Ray Fluorescence Spectrometry;Instrumentation Science & Technology;1999-06
5. Analytical Approximation for Calculating Secondary Fluorescence in X-Ray Fluorescence Analysis of Powdered Materials;X-Ray Spectrometry;1996-09
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