Quantitative XRF analysis of surface layers: Influence of primary energy distribution and enhancement-Reference-Cited by-同舟云学术

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Quantitative XRF analysis of surface layers: Influence of primary energy distribution and enhancement

Published:1988-06 Issue:3 Volume:17 Page:107-115
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Rössiger V.

Publisher

Wiley

Subject

Spectroscopy

Reference13 articles.

1. Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysis

2. Lama I — A General Fortran Program for Quantitative X-ray Fluorescence Analysis

3. Lama III — A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers

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1. Determination of X-ray excitation spectra in micro X-ray fluorescence spectrometry with capillary optics;Spectrochimica Acta Part B: Atomic Spectroscopy;2016-03

2. Determination of the thickness of coatings by means of a new XRF spectrometer;X-Ray Spectrometry;2002-01

3. X-ray tube spectra;X-Ray Spectrometry;1999-07

4. Indirect method of X-ray spectra determination by XRF;X-RAY SPECTROM;1996

5. Evaluating Indirectly the X-ray Tube Spectra on the Basis of the Fundamental Parameter Method in Wavelength-Dispersive X-ray Spectrometry;Advances in X-Ray Analysis;1994

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