Simulation of relationships between substrate XRF intensities and film thicknesses
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference4 articles.
1. Absolute method for determination of metallic film thickness by X-ray fluorescence
2. Absolute x-ray fluorescence method for the determination of metal thicknesses by intensity ratio measurements
3. Monte Carlo simulation of the X-ray fluorescence excited by discrete energy photons in homogeneous samples including tertiary inter-element effects
4. Effects of secondary interactions on thin film thickness measurements using XRF
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Coating Thickness Determination Using X-ray Fluorescence Spectroscopy: Monte Carlo Simulations as an Alternative to the Use of Standards;Coatings;2019-01-29
2. Determination of the thickness of coatings by means of a new XRF spectrometer;X-Ray Spectrometry;2002-01
3. X-Ray Spectrometry;Analytical Chemistry;1994-06-01
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