Absolute x-ray fluorescence method for the determination of metal thicknesses by intensity ratio measurements
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference6 articles.
1. Absolute method for determination of metallic film thickness by X-ray fluorescence
2. and Compilation of X-Ray Cross Sections. Document UCRL 50174, NTIS Lawrence Radiation Laboratory California, Livermore CA (1969).
3. Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflection
4. D'Optique des Rayons X et de Microanalyse (ICXOM 11), p. 67. (1987).
5. Kβ/Kα ratios in energy-dispersive x-ray emission analysis
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