Influence of in-sample scattering of fluorescent radiation on line shapes of Si(Li) detectors in XRF studies
Author:
Publisher
Wiley
Subject
Spectroscopy
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2. Isotope-source, energy-dispersive XRF analysis of geological materials using gas-filled proportional counters: Signal deconvolution using simulated peak shapes;X-RAY SPECTROM;1999
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4. Si(Li) detector response and PIXE spectrum fitting;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
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