Accurate description of surface ionization in electron probe microanalysis: An improved formulation
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference40 articles.
1. in Proceedings of the 3rd International Conference on X-Ray Optics and Microanalysis, edited by and p. 379. Academic Press, New York (1963).
2. A Gaussian expression to describe φ(ρz) curves for quantitative electron probe microanalysis
3. Evaluation of an improved absorption correction based on the Gaussian ionization distribution model for quantitative electron probe microanalysis
4. and in Proceedings of the 11th International Congress on X-Ray Optics and Microanalysis, edited by J. D. Brown, and R. H. Packwood, p. 249 (1986).
5. Universal correction procedure for electron-probe microanalysis. II. The absorption correction
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