Thin-film thickness calculation to maximize X-ray fluorescence intensity in transmission arrangements-Reference-Cited by-同舟云学术

Thin-film thickness calculation to maximize X-ray fluorescence intensity in transmission arrangements

Published:1986-04 Issue:2 Volume:15 Page:103-105
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Fernández J. E.,Mainardi R. T.

Publisher

Wiley

Subject

Spectroscopy

Reference2 articles.

1. A large number of papers on this subject have been published in the Proceedings Series Nuclear Techniques and Mineral Resources of the International Atomic Energy Agency (IAEA), Vienna, Austria and also in the series Advances in X-Ray Analysis and X-Ray Spectrometry, among others.

2. and (Eds), Handbook of Mathematical Functions, Dover, New York (1972).

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improving Multiphase Flowmeter Accuracy for Hydrocarbon Allocation and Wet Gas Production of Unconventional Oil-Gas Wells;Day 1 Mon, February 12, 2024;2024-02-12

2. A High Precision Calculation of the Excitation Flux for X-ray Fluorescence Spectroscopy with Cylindrical Geometry;Applied Spectroscopy Reviews;1998-02

3. Calculation of the X-ray Fluorescence Intensity and Detector Count Rate for Annular Source Geometry;Applied Spectroscopy Reviews;1998-02

4. Dependence of XRF intensity on the tilt of the propagation plane;X-Ray Spectrometry;1989-12

5. Influence of the propagation-plane inclination angle on the fluorescent intensity: Study of the emission of small-thickness samples and determination of the maximum emission angle;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1989-08