Dependence of XRF intensity on the tilt of the propagation plane
Author:
Publisher
Wiley
Subject
Spectroscopy
Reference31 articles.
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1. Resonant Raman scattering background in XRF spectra of binary samples;Radiation Physics and Chemistry;2015-02
2. Theoretical calculations of the influence of resonant Raman scattering on the quantification of XRF spectrochemical analysis;J. Anal. At. Spectrom.;2012
3. Theoretical calculations of detection limits in total reflection XRF analysis;X-RAY SPECTROM;1999
4. Theoretical calculations of detection limits in total reflection XRF analysis;X-Ray Spectrometry;1999-01
5. New spectrometer for grazing exit x-ray fluorescence;Review of Scientific Instruments;1997-07
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