Quantum near field probe for integrated circuits electromagnetic interference at wafer level-Reference-Cited by-同舟云学术

Quantum near field probe for integrated circuits electromagnetic interference at wafer level

Published:2021-12-22 Issue: Volume: Page:
ISSN:1096-4290
Container-title:International Journal of RF and Microwave Computer-Aided Engineering
language:en
Short-container-title:Int J RF Mic Comp-Aid Eng

Author:

Yin Xiaohan¹,Liu Xinyu¹,Gu Bangxing¹,Zhang Jingjing²,Li Xiaochun³,Du Guanxiang¹

Affiliation:

1. School of Communications and Information Engineering Nanjing University of Posts and Telecommunications Nanjing China

2. School of Foreign Studies Nanjing University of Posts and Telecommunications Nanjing China

3. Key Laboratory of Ministry of Education of Design and Electromagnetic Compatibility of High‐Speed Electronic Systems Shanghai Jiao Tong University Shanghai China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/mmce.23036

Reference24 articles.

1. A fiber based diamond RF B-field sensor and characterization of a small helical antenna

2. Analysis of an open-ended coaxial probe with lift-off for nondestructive testing

3. An experimental investigation of the internal magnetic field topography of an operating Hall thruster

4. Generation of two-mode optical signals with broadband frequency tunability and low spurious signal level

5. New low-temperature FKM for effective sealing in the chemical industry

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