Affiliation:
1. Nanjing BOE Display Technology Co., Ltd., Nanjing China
Abstract
Recently, a‐IGZO TFTs have attracted considerable attention
for ultra large‐sized and ultra high‐resolution display due to
high mobility and good uniformity. The life‐time of integrated
gate driver is mainly determined by the stability of low‐level
maintaining and pull‐up TFTs, which always experience severe
performance degradation after a long time operation. In this
paper, a robust a‐IGZO integrated gate driver with dual lowlevel maintaining units is proposed and fabricated for ultra
large‐sized and high resolution TFT‐LCD applications. The
simulation and BTS measurement results demonstrate that
proposed a‐IGZO gate driver has a large VTH shift margin,
which contributes to extended life‐time of circuit operation.