Early defect identification for micro light‐emitting diode displays via photoluminescent and cathodoluminescent imaging
Author:
Affiliation:
1. Department of Electrical Engineering Columbia University New York New York USA
2. Department of Chemical Engineering Brunel University London London UK
3. Lumiode New York New York USA
Funder
National Science Foundation
National Institutes of Health
Publisher
Wiley
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/jsid.985
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