The Simulation of OLED Current Detection Based on Scanning SQUID Microscope-Reference-Cited by-同舟云学术

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The Simulation of OLED Current Detection Based on Scanning SQUID Microscope

Published:2024-11 Issue:8 Volume:34 Page:1-4
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Wang Hai¹,Feng Xuesong²,Yang Aoyue²,He Anran²,Zhang Zhidan²^ORCID,Kong Xiangyan²^ORCID

Affiliation:

1. National Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China

2. Faculty of Electrical Engineering and Computer Science, Ningbo University, Ningbo, China

Funder

Open Research Fund of National Key Laboratory of Materials for Integrated Circuits

Exploring Youth Program of the Natural Science Foundation of Zhejiang Province

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/77/10525238/10577208.pdf?arnumber=10577208

Reference17 articles.

1. Organic electroluminescent diodes

2. Research progress of light out-coupling in organic light-emitting diodes with non-period micro/nanostructures

3. Predicting LED parameters from electroluminescent semiconductor wafer testing;Chen,2015

4. A test method to improve the appearance yield of GaN based LED chips;Peng,2019

5. Wafer-Level Electroluminescence Metrology for InGaN Light-Emitting Diodes

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