An In Situ Synchrotron X‐Ray Diffraction Study on the Influence of Hydrogen on the Crystallization of Ge‐Rich Ge2Sb2Te5-Reference-Cited by-同舟云学术

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An In Situ Synchrotron X‐Ray Diffraction Study on the Influence of Hydrogen on the Crystallization of Ge‐Rich Ge2Sb2Te5

Published:2022-03 Issue:9 Volume:16 Page:2100658
ISSN:1862-6254
Container-title:physica status solidi (RRL) – Rapid Research Letters
language:en
Short-container-title:Physica Rapid Research Ltrs

Author:

Hans Philipp¹^ORCID,Mocuta Cristian²,Richard Marie-Ingrid³,Benoit Daniel⁴,Boivin Philippe⁵,Le-Friec Yannick⁴,Simola Roberto⁵,Thomas Olivier¹

Affiliation:

1. IM2NP UMR 7334 Aix‐Marseille Université CNRS Campus de St‐Jérôme 13397 Marseille Cedex 20 France

2. Synchrotron SOLEIL l'Orme des Merisiers Saint‐Aubin‐BP 48 91192 Gif‐sur‐Yvette France

3. ID01/ESRF The European Synchrotron 71 rue des Martyrs 38043 Grenoble France

4. STMicroelectronics 850 rue Jean Monnet 38920 Crolles France

5. STMicroelectronics 190 Ave Coq 13106 Rousset France

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202100658

Reference28 articles.

1. Structures of stable and metastable Ge2Sb2Te5, an intermetallic compound in GeTe–Sb2Te3 pseudobinary systems

2. H.-S. P.Wong S.Raoux S.Kim J.Liang J. P.Reifenberg B.Rajendran M.Asheghi K. E.Goodson Proc. of the IEEE2010 98 2201.

3. Storage-class memory: The next storage system technology

4. Overview of candidate device technologies for storage-class memory

5. D. J.Wouters R.Waser M.Wuttig Proc. of the IEEE2015 103 1274.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Crystallization kinetics from Ge-rich Ge–Sb–Te thin films: Influence of thickness;Journal of Applied Physics;2023-09-08

2. Phase‐Change and Ovonic Materials (Third Edition);physica status solidi (RRL) – Rapid Research Letters;2022-09

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