Lock-in IR thermography for functional testing of solar cells and electronic devices

Author:

Breitenstein Ottwin

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Instrumentation

Reference23 articles.

1. Shunts due to laser scribing of solar cells evaluated by highly sensitive lock-in thermography

2. Breitenstein, O., Rakotoniaina, J. P., Altmann, F., Schulz, J. and Linse, G. Fault Localization and Functional Testing of ICs by Lock-in Thermography. Proc. 28th Int. Symposium for Testing and Failure Analysis (ISTFA 2002). Nov.3-7, Phoenix, Arizona. pp.29–36.

3. Breitenstein, O. Lock-in IR Thermography for Functional Testing of Electronic Devices. Proc. Quantitative IR Thermography (QIRT 2004). July5-8, Rhode-St-Genèse. pp.B.3.1–B.3.6.

4. Thermal wave imaging with phase sensitive modulated thermography

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