XPS Depth Study on the Liquid Oxidation of Sn-Bi-Zn-X(Al/P) Alloy and the Effect of Al/P on the Film-Reference-Cited by-同舟云学术

XPS Depth Study on the Liquid Oxidation of Sn-Bi-Zn-X(Al/P) Alloy and the Effect of Al/P on the Film

Published:2015 Issue: Volume:2015 Page:1-10
ISSN:1687-8434
Container-title:Advances in Materials Science and Engineering
language:en
Short-container-title:Advances in Materials Science and Engineering

Author:

Wang X. J.¹,Liu N.¹,Shi S.¹,Chen Y. X.²

Affiliation:

1. School of Material and Science Engineering, Jiangsu University of Science and Technology, Zhenjiang 212003, China

2. School of Mechanical and Electrical Engineering, Shanghai Dianji University, Shanghai 201306, China

Abstract

X-ray photoelectron spectroscopy (XPS) was used to study the properties of liquid oxidation of Sn-Bi-Zn (SBZ) solder alloys and the effect of Al/P on the oxide film. The results showed that the oxidation film on SBZ surface was in high concentration of both oxygen and zinc. Adding trace amount of Al/P to SBZ alloys (SBZA/ABZP) decreased the ratio of O/M (M could be Sn, Bi, and Al/P) and changed the film compositions. Layers near the free surface of oxidation film mostly contained Zn2+and Al3+oxides for SBZA. From the half quantitative analysis result, the aluminum had a surface enrichment behavior in liquid solder, so did phosphorus and zinc. Therefore, the Al/P addition changed their stoichiometry such as the ratio of O/M near film surface.

Funder

National Natural Science Foundation of China

Publisher

Hindawi Limited

Subject

General Engineering,General Materials Science

Link

http://downloads.hindawi.com/journals/amse/2015/257231.pdf

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