Far-Field Pattern Reconstruction from Near-Field Data Collected via a Nonconventional Plane-Rectangular Scanning: Experimental Testing
Author:
Affiliation:
1. Dipartimento di Ingegneria Industriale, Università di Salerno, Via Giovanni Paolo II, 132-84084 Fisciano (Salerno), Italy
2. Selex ES, Via Giulio Cesare, 105-80070 Bacoli (Naples), Italy
Abstract
Publisher
Hindawi Limited
Subject
Electrical and Electronic Engineering
Link
http://downloads.hindawi.com/journals/ijap/2014/763687.pdf
Reference33 articles.
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3. Recent Advances in Near-Field to Far-Field Transformation Techniques
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