Time-Resolved Electromagnetic Near-Field Scanning: Dual Sparse Sampling in Time and Space-Reference-Cited by-同舟云学术

Time-Resolved Electromagnetic Near-Field Scanning: Dual Sparse Sampling in Time and Space

Published:2024-06 Issue:3 Volume:66 Page:928-938
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Zhang Yanming¹^ORCID,Ma Peifeng²^ORCID,Jiang Lijun³^ORCID,Gao Steven¹^ORCID

Affiliation:

1. Department of Electronic Engineering, Chinese University of Hong Kong, Shatin, Hong Kong

2. Department of Geography and Resource Management, Institute of Space and Earth Information Science, Chinese University of Hong Kong, Shatin, Hong Kong

3. Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Rolla, MO, USA

Funder

Chinese University of Hong Kong Startup Fund

Research Grants Council of Hong Kong

ITF

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/15/10557217/10494594.pdf?arnumber=10494594

Reference51 articles.

1. Development of 2D Near Field Scanner for Electromagnetic Noise Visualization

2. State of the Art of Near-Field Scanning: Contemporary Standards and Methods

3. Probe Design and Source Reconstruction for Near-Field Scanning and Modeling

4. Near-field scanning for EM emission characterization

5. Efficiency of Sequential Spatial Adaptive Sampling Algorithm to Accelerate Multifrequency Near-Field Scanning Measurement

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