Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks

Abstract

A custom processor based on reconfigurable hardware technology is proposed in order to compute the figure of merit used to measure the quality of the fit of X-ray diffraction peaks. As the experimental X-ray profiles can present many peaks severely overlapped, it is necessary to select the best model among a large set of reasonably good solutions. Determining the best solution is computationally intensive, because this is a hard combinatorial optimization problem. The proposed processors, working in parallel, increase the performance relative to a software implementation.