Effect of Temperature and Humidity on the Degradation Rate of Multicrystalline Silicon Photovoltaic Module

Abstract

In a PV module, the relative humidity (rh) of a front encapsulant is different from that of a backside encapsulant (rhback). In this study, the effective humidity (rheff) in a PV module was investigated to study the effects of moisture variation on the degradation rate (RD). rheffrepresents uniform humidity in a PV module when it is exposed to certain damp heat conditions. Five types of accelerated tests were conducted to derive the relation between rheffand rhback. rheffshowed a linear relationship with rhbackat constant temperature. Two types of models, namely, Eyring and Peck models, were used for predicting theRDof PV modules, and their results were compared. TheRDof PV modules was thermally activated at 0.49 eV. Furthermore, the temperature and rheffhistory of PV modules over one year were determined at two locations: Miami (FL, USA) and Phoenix (AZ, USA). The accumulatedRDvalues based on the temperature and rheffof the modules were calculated by summing the hourly degradation amounts over the time history.