Degradation of Materials and Products Described with Eyring’s Rate Process Theory
Author:
Affiliation:
1. SoftMatt, 15905 Tanberry Dr., Chino Hills, California 91709, United States
Publisher
American Chemical Society (ACS)
Link
https://pubs.acs.org/doi/pdf/10.1021/acssusresmgt.4c00044
Reference26 articles.
1. Thomas, R. E.; Gorton, H. C. Research Toward a Physics of Aging of Electronic Component Parts. In Proceedings of the Second Annual Symposium on the Physics of Failure in Electronics, Chicago, IL, USA, 1963.
2. A Review of Accelerated Test Models
3. A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation
4. A Scientific and Statistical Analysis of Accelerated Aging for Pharmaceuticals. Part 1: Accuracy of Fitting Methods
5. Model Associated with the Study of the Degradation Based on the Accelerated Test: A Literature Review
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