Residual Lifetime Prediction with Multistage Stochastic Degradation for Equipment

Abstract

Residual useful lifetime (RUL) prediction plays a key role of failure prediction and health management (PHM) in equipment. Aiming at the problems of residual life prediction without comprehensively considering multistage and individual differences in equipment performance degradation at present, we explore a prediction model that can fit the multistage random performance degradation. Degradation modeling is based on the random Wiener process. Moreover, according to the degradation monitoring data of the same batch of equipment, we apply the expectation maximization (EM) algorithm to estimate the prior distribution of the model. The real-time remaining life distribution of the equipment is acquired by merging prior information of real-time degradation data and historical degradation monitoring data. The accuracy of the proposed model is demonstrated by analyzing a practical case of metalized film capacitors, and the result shows that a better RUL estimation accuracy can be provided by our model compared with existing models.