A Self-Checking Hardware Journal for a Fault-Tolerant Processor Architecture
Author:
Affiliation:
1. LICM Laboratory, University Paul Verlaine, Metz, 7 rue Marconi, 57070 Metz, France
2. Electrical Engineering Department, Engineering Faculty Lorestan, University Khorramabad, Iran
Abstract
Publisher
Hindawi Limited
Subject
Hardware and Architecture
Link
http://downloads.hindawi.com/journals/ijrc/2011/962062.pdf
Reference20 articles.
1. IBM experiments in soft fails in computer electronics (1978–1994)
2. Radiation-induced soft errors in advanced semiconductor technologies
3. Trends and challenges in VLSI circuit reliability
4. Basic concepts and taxonomy of dependable and secure computing
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