Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAI
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/mst.1998.14.6.531
Reference4 articles.
1. Measurement of the stress in oxide scales formed by oxidation of alumina-forming alloys
2. Determination of the Piezospectroscopic Coefficients for Chromium-Doped Sapphire
3. Stress development in alumina scales formed upon oxidation of (111) NiAl single crystals
4. Lateral growth kinetics of α-alumina accompanying the formation of a protective scale on (111) NiAl during oxidation at 1100 °C
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1. The high‐temperature oxidation resistance of thin‐walled ingots of Ni3Al alloys with directional grain structure;Anti-Corrosion Methods and Materials;2005-08
2. Wet Erosive Wear of Alumina Densified with Magnesium Silicate Additions;Journal of the American Ceramic Society;2004-12-20
3. Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films;Applied Physics Letters;2003-07-07
4. Wet erosion damage of Cr3C2/Al2O3 composite;Journal of Materials Research;2003-05
5. Pressure dependence of Cr3+ fluorescence in theta-alumina;Oxidation of Metals;2001
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