Automatic localisation of electron backscattering pattern bands from Hough transform
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/mst.1996.12.10.837
Reference10 articles.
1. Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope
2. Automatic analysis of electron backscatter diffraction patterns
3. Extracting Straight Lines
4. Use of the Hough transformation to detect lines and curves in pictures
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