A new method for locating Kikuchi bands in electron backscatter diffraction patterns-Reference-Cited by-同舟云学术

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A new method for locating Kikuchi bands in electron backscatter diffraction patterns

Published:2019-09-05 Issue:12 Volume:82 Page:2035-2041
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc Res Tech

Author:

Zhang Yongsheng¹^ORCID,Fang Shangqiang²,Lin Chucheng¹,Zhang Jimei¹,Jiang Caifen¹,Zeng Yi¹,Huang Fuqiang¹,Miao Hong²

Affiliation:

1. The State Key Lab of High Performance Ceramics and Superfine MicrostructureShanghai Institute of Ceramics, Chinese Academy of Science Shanghai China

2. CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern MechanicsUniversity of Science and Technology of China Hefei China

Funder

National Key Research and Development of China

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/jemt.23373

Reference13 articles.

1. Extracting Straight Lines

2. Hough Transform from the Radon Transform

3. A comparison of diffraction techniques for the SEM;Dingley D. J.;Scanning Electron Microscopy,1981

4. Diffraction from sub‐micron areas using electron backscattering in a scanning electron microscope;Dingley D. J.;Scanning electron microscopy,1984

5. Use of the Hough transformation to detect lines and curves in pictures

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