Towards ultrahigh resolution EBSD by low accelerating voltage
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/026708309X12506933873828
Reference15 articles.
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5. Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)
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