Microhardness Measurement as a Quality Control Technique for Thin, Hard Coatings-Reference-Cited by-同舟云学术

Microhardness Measurement as a Quality Control Technique for Thin, Hard Coatings

Published:1987-01 Issue:2 Volume:3 Page:117-122
ISSN:0267-0844
Container-title:Surface Engineering
language:en
Short-container-title:Surface Engineering

Author:

Thomas A.

Publisher

Informa UK Limited

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1179/sur.1987.3.2.117

Reference7 articles.

1. A. J. PERRY, P. LAENG, and H. E. HINTERMANN: in ‘Proceedings of the 8th international conference on CVD’, 475–488; 1981, Pennington, NJ, Electrochemical Society.

2. The hardness of solids

3. Hardness measurements of thin films

4. X‐Ray Fluorescence for Coating Thickness Measurement

5. O. L. DAVIES and P. L. GOLDSMITH: ‘Statistical methods in research and production’; 1972, London, Longman.

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