Abstract
The X‐Ray fluorescence method of coating thickness measurement of ISO 3497, BS 5411 (A), DIN 50987, and ASTM B568–79 is discussed from a practical point of view. A brief illustration of the method's technical principles, advantages, applications, and example instrumentation is given together with some of the precautions to be taken.
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Coating Thickness and its Measurement;Electroplating;2004
2. Physical properties of gold electrodeposits and their effect on thickness measurement;Gold Bulletin;1996-03
3. Tribology;Mechanical Engineers Reference Book;1994
4. Tribology;Mechanical Engineer's Reference Book;1994
5. Materials Potential;Research and Development of High Temperature Materials for Industry;1989