Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion

Author:

Li Xin,Zhang Wangyang,Wang Fa,Sun Shupeng,Gu Chenjie

Publisher

ACM Press

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. FuNToM: Functional Modeling of RF Circuits Using a Neural Network Assisted Two-Port Analysis Method;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28

2. Bayesian Inference on Introduced General Region;Proceedings of the 26th Asia and South Pacific Design Automation Conference;2021-01-18

3. Introduction;Performance-Driven Surrogate Modeling of High-Frequency Structures;2020

4. Large-Scale Circuit Performance Modeling by Bayesian Model Fusion;Machine Learning in VLSI Computer-Aided Design;2019

5. Model-based and data-driven approaches for building automation and control;Proceedings of the International Conference on Computer-Aided Design;2018-11-05

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