Accelerating Coverage Directed Test Generation for Functional Verification

Author:

Wang Fanchao1,Zhu Hanbin1,Popli Pranjay1,Xiao Yao1,Bodgan Paul1,Nazarian Shahin1

Affiliation:

1. University of Southern California, Los Angeles, CA, USA

Publisher

ACM

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Survey of Machine Learning for Software-assisted Hardware Design Verification: Past, Present, and Prospect;ACM Transactions on Design Automation of Electronic Systems;2024-06-21

2. SSFuzz:Generating syntactic and semantic seeds for RISC-V processors;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

3. Exploring Coverage Metrics in Hardware Fuzzing: A Comprehensive Analysis;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

4. Two-dimensional Search Space for Extracting Broadside Tests from Functional Test Sequences;ACM Transactions on Design Automation of Electronic Systems;2024-04-22

5. Robust GNN-Based Representation Learning for HLS;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28

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