Experimental and analytical study of Xeon Phi reliability
Author:
Affiliation:
1. Institute of Informatics, Porto Alegre, RS, Brazil
2. UFSC, Florianópolis, SC, Brazil
3. Los Alamos National Laboratory
4. University of Massachusetts
Funder
Conselho Nacional de Desenvolvimento Científico e Tecnológico
Ministério da Ciência, Tecnologia e Inovação
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3126908.3126960
Reference48 articles.
1. Understanding the propagation of transient errors in HPC applications
2. Radiation-induced soft errors in advanced semiconductor technologies. Device and Materials Reliability;Baumann R.C.;IEEE Transactions on,2005
3. R. Baumann. 2005. Soft errors in advanced computer systems. Design Test of Computers IEEE 22 3 (2005). 10.1109/MDT.2005.69 R. Baumann. 2005. Soft errors in advanced computer systems. Design Test of Computers IEEE 22 3 (2005). 10.1109/MDT.2005.69
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