TailCut-Reference-Cited by-同舟云学术

TailCut

Published:2022-07-10 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 59th ACM/IEEE Design Automation Conference
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Author:

Lee Jaeyong¹,Kim Myungsunk²,Choi Wonil³,Lee Sanggu¹,Kim Jihong¹

Affiliation:

1. Seoul National University

2. Kyungpook National University

3. Hanyang University

Funder

National Research Foundation of Korea (NRF)

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3489517.3530471

Reference9 articles.

1. K. Mizoguchi , " Lateral charge migration suppression of 3d-nand flash by vth nearing for near data computing," in Proceedings of the IEEE International Electron Devices Meeting (IEDM) , 2017 . K. Mizoguchi et al., "Lateral charge migration suppression of 3d-nand flash by vth nearing for near data computing," in Proceedings of the IEEE International Electron Devices Meeting (IEDM), 2017.

2. Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation

3. H. Li , " The case of femu: Cheap, accurate, scalable and extensible flash emulator.," in Proceedings of the USENIX Conference on File and Storage Technologies (FAST) , 2018 . H. Li et al., "The case of femu: Cheap, accurate, scalable and extensible flash emulator.," in Proceedings of the USENIX Conference on File and Storage Technologies (FAST), 2018.

4. Inside NAND Flash Memories

5. A 21 nm High Performance 64 Gb MLC NAND Flash Memory With 400 MB/s Asynchronous Toggle DDR Interface

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