ageOpt-RMT-Reference-Cited by-同舟云学术

ageOpt-RMT

Published:2016-06-05 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 53rd Annual Design Automation Conference
language:
Short-container-title:

Author:

Kriebel Florian¹,Rehman Semeen²,Shafique Muhammad¹,Henkel Jörg³

Affiliation:

1. Karlsruhe Institute of Technology, Germany

2. TU Dresden, Germany

3. Karlsruhe Institute of Technology Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2897937.2897980

Reference29 articles.

1. Reliable on-chip systems in the nano-era

2. Multi-Layer Dependability

3. Within-die variation-aware dynamic-voltage-frequency-scaling with optimal core allocation and thread hopping for the 80-core teraflops processor;Dighe S.;IEEE JSSC,2011

4. A comprehensive model of PMOS NBTI degradation;Alam M.;Microelectronics Reliability,2005

5. Facelift: Hiding and slowing down aging in multicores

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