A machine learning approach to fab-of-origin attestation-Reference-Cited by-同舟云学术

A machine learning approach to fab-of-origin attestation

Published:2016-11-07 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 35th International Conference on Computer-Aided Design
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Author:

Ahmadi Ali¹,Bidmeshki Mohammad-Mahdi¹,Nahar Amit²,Orr Bob²,Pas Michael²,Makris Yiorgos¹

Affiliation:

1. The University of Texas at Dallas

2. Texas Instruments Inc.

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2966986.2966992

Reference16 articles.

1. T. W. Anderson etal "Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes " The annals of mathematical statistics pp. 193--212 1952. T. W. Anderson et al. "Asymptotic theory of certain "goodness of fit" criteria based on stochastic processes " The annals of mathematical statistics pp. 193--212 1952.

2. Hardware Trojan Attacks: Threat Analysis and Countermeasures

3. DARPA. SB133-003: Electronic component fingerprinting to determine manufacturing origin. {Online}. Available: http://www.acq.osd.mil/osbp/sbir/solicitations/sbir20133/darpa133.htm DARPA. SB133-003: Electronic component fingerprinting to determine manufacturing origin. {Online}. Available: http://www.acq.osd.mil/osbp/sbir/solicitations/sbir20133/darpa133.htm

4. Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

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