Author:
Liaperdos John,Arapoyanni Angela,Tsiatouhas Yiorgos
Publisher
Springer International Publishing
Reference47 articles.
1. E. Acar, S. Ozev, Defect-based RF testing using a new catastrophic fault model, in Proceedings of the IEEE International Test Conference (ITC) (2005), pp. 429–437
2. A. Ahmadi, M.M. Bidmeshki, A. Nahar, B. Orr, M. Pas, Y. Makris, A machine learning approach to fab-of-origin attestation, in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (2016), pp. 1–6.
https://doi.org/10.1145/2966986.2966992
3. S.S. Akbay, A. Halder, A. Chatterjee, D. Keezer, Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 27(2), 352–363 (2004)
4. M. Allen, Understanding Regression Analysis (Springer, US, 1997)
5. F.D. Bernardinis, M.I. Jordan, A. SangiovanniVincentelli, Support vector machines for analog circuit performance representation, in Proceedings 2003. Design Automation Conference (2003), pp. 964–969.
https://doi.org/10.1145/775832.776074
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