Covering SPL Behaviour with Sampled Configurations-Reference-Cited by-同舟云学术

Covering SPL Behaviour with Sampled Configurations

Published:2015 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the Ninth International Workshop on Variability Modelling of Software-intensive Systems - VaMoS '15
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Author:

Devroey Xavier,Perrouin Gilles,Legay Axel,Schobbens Pierre-Yves,Heymans Patrick

Funder

Fonds De La Recherche Scientifique - FNRS

Publisher

ACM Press

Reference39 articles.

1. M. Al-Hajjaji, T. Thüm, J. Meinicke, M. Lochau, and G. Saake. Similarity-based prioritization in software product-line testing. In S. Gnesi, A. Fantechi, P. Heymans, J. Rubin, and K. Czarnecki, editors, 18th International Software Product Line Conference, SPLC '14, Florence, Italy, September 15-19, 2014, pages 197--206. ACM, 2014.

2. H. Cichos, S. Oster, M. Lochau, and A. Schürr. Model-based Coverage-driven Test Suite Generation for Software Product Lines. In MODELS '11, LNCS, pages 425--439. Springer, 2011.

3. A. Classen. Modelling with FTS: a Collection of Illustrative Examples. Technical Report P-CS-TR SPLMC-00000001, PReCISE Research Center, University of Namur, Namur, Belgium, 2010.

4. A. Classen, M. Cordy, P.-Y. Schobbens, P. Heymans, A. Legay, and J.-F. Raskin. Featured Transition Systems : Foundations for Verifying Variability-Intensive Systems and their Application to LTL Model Checking. TSE, 39(8):1069--1089, 2013.

5. D. M. Cohen, S. R. Dalal, M. L. Fredman, and G. C. Patton. The AETG System: an approach to testing based on combinatorial design. IEEE Transactions on Software Engineering, 23(7):437--444, 1997.

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