Affiliation:
1. Seoul National University
2. Samsung Electronics
Abstract
How can we accurately identify new memory workloads while classifying known memory workloads? Verifying DRAM (Dynamic Random Access Memory) using various workloads is an important task to guarantee the quality of DRAM. A crucial component in the process is open-set recognition which aims to detect new workloads not seen in the training phase. Despite its importance, however, existing open-set recognition methods are unsatisfactory in terms of accuracy since they fail to exploit the characteristics of workload sequences.
In this article, we propose
Acorn
, an accurate open-set recognition method capturing the characteristics of workload sequences.
Acorn
extracts two types of feature vectors to capture sequential patterns and spatial locality patterns in memory access.
Acorn
then uses the feature vectors to accurately classify a subsequence into one of the known classes or identify it as the unknown class. Experiments show that
Acorn
achieves state-of-the-art accuracy, giving up to 37% points higher unknown class detection accuracy while achieving comparable known class classification accuracy than existing methods.
Funder
Samsung Electronics Co., Ltd.
The Institute of Engineering Research and ICT at Seoul National University
Publisher
Association for Computing Machinery (ACM)
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