Improving scan chain diagnostic accuracy using multi-stage artificial neural networks
Author:
Affiliation:
1. National Tsing Hua University, Taiwan
2. Mentor
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3287624.3287692
Reference24 articles.
1. On Diagnosis of Faults in a Scan Chain;Kundu S.;Proc. of VLSI Test Symposium (VTS),1993
2. A Technique for Fault Diagnosis of Defects in Scan Chains;Guo R.;Proc. of Int'l Test Conf. (ITC),2001
3. Survey of Scan Chain Diagnosis
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