Modeling the Propagation of Soft Errors in Programs-Reference-Cited by-同舟云学术

Modeling the Propagation of Soft Errors in Programs

Published:2019 Issue: Volume: Page:
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Container-title:Proceedings of the 2nd International Conference on Computer Science and Software Engineering - CSSE 2019
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Author:

Xue Lixing¹,Zhang Zhan¹,Zou Decheng¹

Affiliation:

1. School of Computer Science and Technology, Harbin Institute of Technology, China

Publisher

ACM Press

Reference29 articles.

1. R.C. Baumann (2001). Soft errors in advanced semiconductor devices-part I: the three radiation sources. IEEE Transactions on Device and Materials Reliability Device, 1(1), 17--22.

2. R.C. Baumann. 2002. Soft errors in commercial semiconductor technology: overview and scaling trends. In Proceedings of IEEE 2002 Reliability Physics Tutorial Notes, Reliability Fundamentals. Dallas, TX, USA, April 7-11 2002; pp. 121.

3. J.F. Ziegler, H.W. Curtis and H.P. Muhlfeld (1996). IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development, 40(1), 3--18.

4. S.S. Mukherjee, J. Emer and S.K. Reinhardt. 2005. The soft error problem: an architectural perspective. In Proceedings of 11th International Symposium on High-Performance Computer Architecture, San Francisco, CA, USA, February 12-16 2005; pp. 243--247.

5. X. Xu and H.H. Huang (2016). On Soft Error Reliability of Virtualization Infrastructure. IEEE Transactions on Computers, 65(12), 3727--3739.

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