NBTI-aware power gating for concurrent leakage and aging optimization
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ACM Press
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Comprehensive Assessment of Current Trends in Negative Bias Temperature Instability (NBTI) Deterioration;2021 7th International Conference on Signal Processing and Communication (ICSC);2021-11-25
2. NBTI-Aware Power Gating Design with Dynamically Varying Stress Probability Control on Sleep Transistor;Journal of Circuits, Systems and Computers;2021-02-27
3. Circuit-Level Mitigation Approaches;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021
4. Sizing of the CMOS 6T‐SRAM cell for NBTI ageing mitigation;IET Circuits, Devices & Systems;2020-04-30
5. Multi Header Based Ultra Low Power MTCMOS Technique to Reduce NBTI Effect in Combinational Circuit;Advances in Intelligent Systems and Computing;2020
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